エネルギー科学の学理の確立をはかる

共同利用設備

装置番号 装置名・型番 管理責任者
B001-01 Matrix assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS)

AXIMA Performance, SHIMADZU

河本晴雄教授
B001-02 X-ray diffractometer (XRD)

Hyper-RINT, Rigaku

高井茂臣准教授
B002-01 X-ray diffractometer (XRD)

X’Part PRO, PANalytical

平藤哲司教授
B002-02 X-ray diffractometer (XRD)

X’Part PRO, PANalytical

土井俊哉教授
B002-03 Glow discharge emission spectrometer

GDLS-9950A, SHIMADZU

平藤哲司教授
B002-04 Transmission electron microscope (TEM)

JEM-2010, JEOL

奥村英之准教授
B002-05 X-ray absorption fine structure (XAFS)

R-EXAFS 2000-T/F, Rigaku

高井茂臣准教授
B002-06 X-ray photoelectron spectrometer (XPS)

JPS-9030, JEOL

三宅正男准教授
B002-07 Chemisorption analyzer

AutoChem Ⅱ 2920, SHIMADZU

小川敬也助教
B002-08 Scanning prove microscope (SPM)

SPM-8100FM, SHIMADZU

河本晴雄教授
B002-09 Zeta-potential & particle size analyzer 
ELSZ2000ZS, Otsuka Electronics Co., Ltd.
蜂谷寛准教授
B002-10 Circular dichroism spectrometer (CD)
J-1500, JASCO Corporation
岡崎豊助教
B003-01 Laser microscope

VK-9700, KEYENCE

安部正高准教授

B003-02 Scanning electron microscopy (SEM)

VE-9800, KEYENCE

安部正高准教授

B003-03 Precision universal / Tensile tester

AG-100kNX, SHIMADZU

安部正高准教授

B003-04 Hardness tester

DUH-211S, SHIMADZU

安部正高准教授

B003-05 Hardness tester

HMV-2TADW, SHIMADZU

安部正高准教授

B003-06 Field emission scanning electron microscopy (FE-SEM)

SU6600, Hitachi High-Technologies

高井茂臣准教授
PAGETOP