List of sharing equipment
Equipment No. | Equipment name | Contact person |
B001-01 | Matrix assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS)
AXIMA Performance, SHIMADZU |
Prof. Haruo Kawamoto |
B001-02 | X-ray diffractometer (XRD)
Hyper-RINT, Rigaku |
Associate Prof. Shigeomi Takai |
B002-01 | X-ray diffractometer (XRD)
X’Part PRO, PANalytical |
Prof. Tetsuji Hirato |
B002-02 | X-ray diffractometer (XRD)
X’Part PRO, PANalytical |
Prof. Toshiya Doi |
B002-03 | Glow discharge emission spectrometer
GDLS-9950A, SHIMADZU |
Prof. Tetsuji Hirato |
B002-04 | Transmission electron microscope (TEM)
JEM-2010, JEOL |
Associate Prof. Hideyuki Okumura |
B002-05 | X-ray absorption fine structure (XAFS)
R-EXAFS 2000-T/F, Rigaku |
Associate Prof. Shigeomi Takai |
B002-06 | X-ray photoelectron spectrometer (XPS)
JPS-9030, JEOL |
Associate Prof. Masao Miyake |
B002-07 | Chemisorption analyzer
AutoChem Ⅱ 2920, SHIMADZU |
Assistant Prof. Takaya Ogawa |
B002-08 | Scanning prove microscope (SPM)
SPM-8100FM, SHIMADZU |
Prof. Haruo Kawamoto |
B002-09 | Zeta-potential & particle size analyzer ELSZ2000ZS, Otsuka Electronics Co., Ltd. |
Associate Prof. Kan Hachiya |
B002-10 | Circular dichroism spectrometer (CD) J-1500, JASCO Corporation |
Assistant Prof. Yutaka Okazaki |
B003-01 | Laser microscope
VK-9700, KEYENCE |
Associate Prof. Masataka Abe |
B003-02 | Scanning electron microscopy (SEM)
VE-9800, KEYENCE |
Associate Prof. Masataka Abe |
B003-03 | Precision universal / Tensile tester
AG-100kNX, SHIMADZU |
Associate Prof. Masataka Abe |
B003-04 | Hardness tester
DUH-211S, SHIMADZU |
Associate Prof. Masataka Abe |
B003-05 | Hardness tester
HMV-2TADW, SHIMADZU |
Associate Prof. Masataka Abe |
B003-06 | Field emission scanning electron microscopy (FE-SEM)
SU6600, Hitachi High-Technologies |
Associate Prof. Shigeomi Takai |